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CALCULATION OF THE EFFECT OF SLIT SIZE ON EMITTANCE MEASUREMENTS MADE BY A TWO-SLIT SCANNER

Document #:
Project X-doc-1357-v1
Document type:
technical note
Submitted by:
Alexander Shemyakin
Updated by:
Alexander Shemyakin
Document Created:
23 Mar 2015, 15:06
Contents Revised:
23 Mar 2015, 15:06
DB Info Revised:
23 Mar 2015, 15:06
Viewable by:
  • Public document
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Abstract:
Parallel slit-slit devices are commonly used to measure the transverse emittance of a particle beam, selecting a portion of the beam with the front slit and measuring the
angular distribution with the rear. This paper calculates the effect of finite slit sizes on measured emittance and Twiss functions in the case of Gaussian spatial and angular
distributions of the oncoming beam. A formula for recovering the true emittance from the measured values is derived.
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Keywords:
Emittance
Notes and Changes:
The document is also in arXiv as
http://arxiv.org/abs/1503.06055
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